Nanosensorics (FB16-2285)

(Prof. Dr. Thomas Kusserow)

The lecture is given in English language.

The Lecture at Moodle (Link)

Fundamentals of Nanosensorics

Optical Microscopy

• Resolution Limits
• Contrasting Techniques
• Scanning Confocal Microscopy
• STED and 4pi Microscopy

Electron and Ion Beam Microscopy

• SEM
• TEM
• FIB
• Ion Beam Microscopes

Scanning Probe Microscopy

• AFM
• STM
• SNOM

Semiconductor Analytics

• XRD
• RHEED
• PL
• Raman Spectroscopy
• Laser Gain

Ellipsometry

• Null Ellipsometer
• Spectral Ellipsometry
• Parameter Modelling

Bhushan (Ed.):Springer Handbook of Nanotechnology, Springer Verlag
Träger (Ed.): Springer Handbook of Lasers and Optics, Springer Verlag
Lawes: Scanning electron microscopy and X-ray microanalysis, Wiley
Reimer: Scanning electron microscopy, Springer Verlag
Goldstein: Scanning electron microscopy and x-ray microanalysis, Kluwer Academic
Brent: Transmission electron microscopy and diffractometry of materials, Springer Verlag
Reimer: Transmission electron microscopy, Springer Verlag
Giannuzzi: Introduction to Focused Ion Beams, Springer Verlag
Dror: Scanning force microscopy, Oxford University Press
Wiesendanger: Scanning probe microscopy, Springer Verlag
Stroscio: Scanning tunneling microscopy, Academic Press
Bai: Scanning tunneling microscopy and its applications, Springer Verlag
Paesler: Near field optics, Wiley
Fillard: Near field optics and nanoscopy, World Scientific
Kittel: Introduction to solid state physics, wiley
Ibach: Solid-state physics, Springer Verlag
Ashcroft: Solid state physics, Brooks/Cole
Bauer: Optical characterization of epitaxial semiconductor layers, Springer Verlag
Schroder: Semiconductor material and device characterization, Wiley
Tompkins (Ed.): Handbook of ellipsometry, W.Andrew Pub./Springer
Azzam: Ellipsometry and polarized light, North-Holland

The schedule of the nanosensorics lab and the related laser safety instructions seminar will be given during the lecture.