Zielpräparationsinstrument EM TXP (Leica)

  • (opens enlarged image)General view of the instrument
  • (opens enlarged image)Sample holder of the instrument

EM TXP target preparation instrument (Leica)

The Leica EM TXP is a target preparation instrument for the mechanical preparation of non-embedded specimens in the millimeter range. An integrated stereo microscope in combination with a specimen swivel arm allows the specimens to be viewed at angles between 0° and 60° during processing. Samples can be processed by milling, sawing, grinding, drilling and polishing, and all process steps for sample preparation can be carried out without removing the sample from the instrument.

The instrument has an integrated automatic process control. Its functions include automatic east-west guidance, time or distance countdown and force-controlled feedback control.