Publikationen vor 2009

Tagungsbeiträge

  • J. Niehues, P. Lehmann,
    Extended low-coherence interferometry for high precision microscopic form and surface measurement,
    Proceedings International Conference on Precision Measurement, ICPM 2008.
     
  • J. Niehues, P. Lehmann,
    Dual-wavelength vertical scanning low-coherence interference microscopy,
    SPIE Proceedings Vol. 6616  (2007) 661606.
     

Fachzeitschriften

  • P. Lehmann,
    Advanced approaches to high precision MENS metrology based on interferometric, confocal, and tactile techniques,
    Optoelectronics Letters 4, No.2 (2008) 143-146.
     
  • J. Niehues, P. Lehmann, K. Bobey,
    Dual-wavelength vertical scanning low-coherence interference microscopy,
    Applied Optics 46, No. 29 (2007) 7141-7148.
     
  • F. Depiereux, P. Lehmann, T. Pfeiffer, R. Schmitt,
    Fiber-optical sensor with miniaturized probe head and nanometer accuracy based on spatially modulated low-coherence interferogram analysis,
    Applied Optics 46, No. 17 (2007) 3425-3431.
     
  • P. Lehmann, S. Patzelt, G. Goch,
    Polychromatische Fernfeld-Specklemuster mit kontinuierlichem oder diskretem Spektrum zur Charakterisierung von Oberflächenrauheiten,
    Technisches Messen 69, Heft 5 (2002) 263-269.
     
  • P. Lehmann,
    Aspect ratio of elongated polychromatic far-field speckles of continuous and discrete spectral distribution with respect to surface roughness characterization,
    Applied Optics 41 No. 10 (2002) 2008-2014.
     
  • S. Patzelt, P. Lehmann, A. Ciossek, G. Goch,
    In-process-Charakterisierung von Oberflächen-Mikrotopographien mittels Specklekorrelations-Verfahren,
    Technisches Messen 67, Heft 10 (2000) 415-420.
     
  • P. Lehmann, S. Patzelt, A. Ciossek,
    In-process Charakterisierung von Mikrotopographien technischer Oberflächen durch polychromatische Speckleautokorrelation,
    Technisches Messen 66, Heft 7-8 (1999) 269-276.
     
  • P. Lehmann,
    Surface roughness measurement based on the intensity correlation function of scatted light under speckle-pattern illumination,
    Applied Optics 38, No. 7 (1999) 1144-1152.
     
  • P. Lehmann, S. Patzelt, A. Schöne,
    Surface roughness measurement by means of polychromatic speckle elongation,
    Applied Optics 36, No. 10 (1997) 2188-2197.