Spectroscopic Ellipsometer
The spectroscopic ellipsometer is used to determine layer thicknesses and refractive indices. Wavelengths from 190 nm - 2400 nm can be used for measurement.
Manufacturer: J. A. Woollam
M. Sc. Lukas Wolfram (PhD Student)
- Telephone
- +49 561 804-4745
- Fax
- +49 561 804-4555
- lukas.wolfram[at]uni-kassel[dot]de
- Website
- Wrinkled Amorphous Films