Atomic Force Microscope Dimension Icon (Bruker)
The Atomic Force Microscopy (AFM) is the preferred method for characterizing sample surfaces with high resolution (down to < 1 nm). Topography, roughness, adhesion, friction and electrical surface potential can be investigated on the micrometer to nanometer scale. The Bruker Dimension Icon microscope also gives us access to the nanomechanical properties of material surfaces.
Specifications
- Icon XYZ closed-loop scanner with scan area 85 x 85 µm x 9 µm
- Nanoscope 6 controller with 8 simultaneous data channels
- Sample positioning stage 150 x 150 x 15 mm with optical microscope
Access
The instrument is intended to support the research of other working groups through collaborations. We warmly recommend our lecture on AFM basics to interested scientists of the University of Kassel.
Acknowledgments
We would like to thank the University of Kassel and the State of Hesse for their financial support.